Particle Characterization of Specialty Chemicals

on demand webinar

In specialty and fine chemicals manufacturing, particle characterization is critical to achieving the highest-value product and performance. Before a formulation can be optimized, it is important to understand the relationship between its components. Particle properties such as particle size and surface charge are often optimized during the formulation of new products to enhance efficacy and stability, often improving its shelf life. Therefore, particle characterization is a critical step to growing end-product value.

Process control may require continuous particle size monitoring. Final quality control may include testing to defined particle size and zeta potential specifications.

In this webinar, Mark Bumiller, technology manager, investigates the importance of particle analysis in specialty and fine chemicals manufacturing.

Key topics include:

  • Why particle characterization is critical to achieving the highest-value product formulations and performance
  • Approaches to particle size analysis and the special instrumentation used in the process
  • How zeta potential predicts dispersion stability
  • Industrial examples from:
    • Inks
    • Emulsions
    • Pigments


About the Presenter:

Mark Bumiller
Scientific Instruments Technology Manager, Entegris

mark-bumiller-11457-90x90 -1Mark has worked in the field of particle size analysis for over 35 years. Positions held include product manager at Hiac Royco (5 years), technical support manager and vice president of business development at Malvern Instruments (17 years), vice president of particle products at Horiba (6 years) and technology manager at Particle Sizing Systems, LLC, and now Entegris (6 years). He has served as a member of the expert committee for USP <788>, the executive committee of the International Fine Particle Research Institute (IFPRI), and the executive committee of Particle Technology Forum of the American Institute of Chemical Engineers. Mark is an active member of Technical Committee 24 within ISO helping to write standards for particle size and zeta potential analysis. His B.S. in chemical engineering was earned at Carnegie Mellon University in Pittsburgh, PA.